Microwave electric-field imaging using a high-Tc scanning superconducting quantum interference device

被引：5

作者：

Chatraphorn, S ^{[1
]}

Fleet, EF ^{[1
]}

Black, RC ^{[1
]}

Wellstood, FC ^{[1
]}

机构：

[1] Univ Maryland, Dept Phys, Ctr Superconduct Res, College Pk, MD 20742 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 07期

关键词：

D O I：

10.1063/1.122060

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used a 77 K thin-film YBa2Cu3O7 superconducting quantum interference device (SQUID) in a scanning SQUID microscope to image room-temperature sources of high-frequency electric field. We find that time-varying electric fields capacitively induce currents in the SQUID, which in turn are rectified by the nonlinearity of the SQUID current-voltage characteristics, leading to changes in the quasistatic voltage across the SQUID. By observing changes in the voltage modulation depth Delta V of the SQUID as a sample is scanned past the SQUID, we obtain electric-field images in the 1-15 GHz frequency range with a SQUID-to-sample separation of about 80 mu m. (C) 1998 American Institute of Physics.

引用

页码：984 / 986

页数：3

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