Semi-insulating GaN and its evaluation for α particle detection

被引:47
作者
Vaitkus, J
Cunningham, W
Gaubas, E
Rahman, M
Sakai, S
Smith, KM
Wang, T
机构
[1] Vilnius Univ, Inst Mat Sci & Appl Res, LT-2040 Vilnius, Lithuania
[2] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
[3] Univ Tokushima, Satellite Venture Business Lab, Dept Elect & Elect Engn, Tokushima 770, Japan
[4] Nitride Semicond Co Ltd, Tokushima 7710360, Japan
关键词
GaN; alpha-particle detection;
D O I
10.1016/S0168-9002(03)01550-X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The application of semi-insulating GaN for detection of ionising particles, specifically alpha-particles, is presented. The electrical properties of GaN epitaxial layers have been investigated and the space charge limited and Ohmic currents were observed. A microwave method was used for temporal measurements if the photocurrent. Transient behaviour of the injection current and photo-response was observed, with a wide range of instantaneous time constants. The charge collection efficiency was measured to be approximately 100% and the role of inhomogeneities in the charge collection peculiarities was analysed. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:60 / 64
页数:5
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