Low energy electron microscopy of quantum well resonances in Ag films on W(110)

被引：16

作者：

Altman, MS ^{[1
]}

机构：

[1] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2005年 / 17卷 / 16期

关键词：

D O I：

10.1088/0953-8984/17/16/001

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Laterally resolved measurements of the quantum size effect in electron reflectivity are made with low energy electron microscopy on Ag films on a W(110) surface. Intensity peaks are observed that are associated with quantum well (QW) resonances above the vacuum level. The unoccupied band structure in the Γ L direction is determined from a phase accumulation model analysis of experimental data. This analysis also identifies a substantial influence of the reflection phase at the W(110) interface on the QW resonance intensity peak positions observed in experiment.

引用

页码：S1305 / S1310

页数：6

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