Effect of substrate texture on thin film disk noise

被引：7

作者：

Xing, XZ ^{[1
]}

Lin, GH ^{[1
]}

Johnson, KE ^{[1
]}

Bertram, HN ^{[1
]}

机构：

[1] IBM CORP,DIV STORAGE SYST,SAN JOSE,CA 95193

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/20.538694

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work, the effects of substrate texture on thin film disk noise have been studied via recording spectral analysis. Both the total texture noise power and spectral shape were found to be dependent upon not only the texture, but also the recording density. An analytical expression for the texture noise spectrum was derived by relating texture noise to the disk surface topography. It was found that the texture noise can be characterized by the texture roughness sigma(p) and the down-track correlation length l. The values of I and sigma(p) were determined by fitting the theoretical expression with the measured spectrum. AFM measurements were also performed to examine the surface structure of the textured disk. The results agree with that of the recording spectral analysis.

引用

页码：3575 / 3577

页数：3