Real-time scanning hall probe microscopy

被引：205

作者：

Oral, A ^{[1
]}

Bending, SJ ^{[1
]}

Henini, M ^{[1
]}

机构：

[1] UNIV NOTTINGHAM,DEPT PHYS,NOTTINGHAM NG7 2RD,ENGLAND

来源：

APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 09期

关键词：

D O I：

10.1063/1.117582

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 77 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensional electron gas (2DEG) is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques. Flux penetration into a high T-c YBa2Cu3O7-delta thin film has been observed in real time at 85 K with single vortex resolution. Flux is seen to enter the film in the form of vortex bundles as well as single flux quanta, Phi(0). (C) 1996 American Institute of Physics.

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收藏

页码：1324 / 1326

页数：3

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