Magnetic homogeneity of colossal-magnetoresistance thin films determined by alternating current magnetic susceptibility

被引：27

作者：

Araujo-Moreira, FM ^{[1
]}

Rajeswari, M

Goyal, A

Ghosh, K

Smolyaninova, V

Venkatesan, T

Lobb, CJ

Greene, RL

机构：

[1] Univ Maryland, Dept Phys, Ctr Supercond Res, College Pk, MD 20742 USA

[2] Univ Fed Sao Carlos, Dept Fis, Grp Superconduct & Magnetismo, BR-13565905 Sao Carlos, SP, Brazil

[3] Univ Maryland, Dept Elect Engn, College Pk, MD 20742 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 23期

关键词：

D O I：

10.1063/1.122795

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report measurements of the alternating current (ac) magnetic susceptibility, chi(ac) = chi' + i chi ", performed on colossal-magnetoresistance (CMR) materials. We have studied thin film samples of La0.67Ca0.33MnO3 and Nd0.7Sr0.3MnO3. For homogeneous samples, the temperature of the peak observed in chi "( T) is in agreement with the temperature of peak resistivity (T-p) obtained from transport measurements. This agreement is not found for inhomogeneous samples, where chi "(T) shows multiple peaks. The analysis of chi "(T) enables one to determine the quality of the CMR materials. The results obtained in thin films of La0.67Ca0.33MnO3 and Nd0.7Sr0.3MnO3, are consistent with those obtained from an homogeneous single crystal of La0.80Sr0.20MnO3. We show that the contactless ac magnetic susceptibility technique is a quick method to reveal inhomogeneities which are not directly evident in direct current transport measurements. (C) 1998 American Institute of Physics. [S0003-6951(98)01049-3].

引用

页码：3456 / 3458

页数：3

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