Fast reflectional symmetry detection using orientation histograms

被引：54

作者：

Sun, C

Si, D

机构：

[1] CSIRO, N Ryde, NSW 2113, Australia

[2] Beijing Univ Aeronaut & Astronaut, Dept Elect Engn, Beijing 100083, Peoples R China

来源：

REAL-TIME IMAGING | 1999年 / 5卷 / 01期

关键词：

D O I：

10.1006/rtim.1998.0135

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

A simple and fast reflectional symmetry detection algorithm has been developed in this paper. The algorithm employs only the original gray scale image and the gradient information of the image, and it is able to detect multiple reflectional symmetry axes of an object in the image. The directions of the symmetry axes are obtained from the gradient orientation histogram of the input gray scale image by using the Fourier method. Both synthetic and real images have been tested using the proposed algorithm. (C) 1999 Academic Press

引用

页码：63 / 74

页数：12

共 19 条

[1]

ATALLAH MJ, 1985, IEEE T COMPUT, V34, P663, DOI 10.1109/TC.1985.1676605

[2] FACIAL FEATURES AND AXIS OF SYMMETRY EXTRACTED USING NATURAL ORIENTATION INFORMATION [J].