The role of the hole-extraction layer in determining the operational stability of a polycarbazole: fullerene bulk-heterojunction photovoltaic device

被引：23

作者：

Bovill, E. ^{[1
]}

Scarratt, N. ^{[1
]}

Griffin, J. ^{[1
]}

Yi, H. ^{[2
]}

Iraqi, A. ^{[2
]}

Buckley, A. R. ^{[1
]}

Kingsley, J. W. ^{[3
]}

Lidzey, D. G. ^{[1
]}

机构：

[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England

[2] Univ Sheffield, Dept Chem, Sheffield S3 7HF, S Yorkshire, England

[3] Ossila Ltd, Kroto Innovat Ctr, Sheffield S3 7HQ, S Yorkshire, England

来源：

APPLIED PHYSICS LETTERS | 2015年 / 106卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

SOLUTION-PROCESSED MOO3; INDIUM-TIN-OXIDE; WORK-FUNCTION; VANADIUM-OXIDE; SOLAR-CELLS; TRANSPORT LAYER; LOW-TEMPERATURE; THIN-FILMS; POLYMER; CONDUCTIVITY;

D O I：

10.1063/1.4909530

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have made a comparative study of the relative operational stability of bulk-heterojunction organic photovoltaic (OPV) devices utilising different hole transport layers (HTLs). OPV devices were fabricated based on a blend of the polymer PCDTBT with the fullerene PC70BM, and incorporated the different HTL materials PEDOT:PSS, MoOx and V2O5. Following 620 h of irradiation by light from a solar simulator, we find that devices using the PEDOT: PSS HTL retained the highest efficiency, having a projected T-80 lifetime of 14 500 h. (C) 2015 AIP Publishing LLC.

引用

页数：5

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