Determination of ultra-trace concentrations of elements in high purity tellurium by inductively coupled plasma mass spectrometry after Fe(OH)3 coprecipitation

被引:54
作者
Duan, TC [1 ]
Kang, JZ [1 ]
Chen, HT [1 ]
Zeng, XJ [1 ]
机构
[1] Chinese Acad Sci, Changchun Inst Appl Chem, State Key Lab Electroanalyt Chem, Changchun 130022, Peoples R China
基金
中国国家自然科学基金;
关键词
high purity; tellurium; inductively coupled plasma mass spectrometry; Fe(OH)(3) coprecipitation;
D O I
10.1016/S0584-8547(03)00142-3
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
In this work, a method was established for the determination of impurities in high purity tellurium by inductively coupled plasma mass spectrometry (ICP-MS) after Fe(OH)(3) coprecipitation. After comparison of coprecipitation ability and separation efficiency between Fe(OH), and Al(OH)(3), Fe(OH)(3) was chosen as the precipitate. A separation factor of 160 for 200 mg tellurium was obtained under conditions of pH 9 and 2 mg of Fe3(+). The 13 elements, such as Bi, Sn, Pb, In, Tl, Cd, Cu, Co, Ni, Zn, Ti, Be and Zr, could be almost completely coprecipitated under these conditions. In addition, Te memory effect imposed on the ICP-MS instrument was assessed, as well as Te matrix effect that caused the low recovery of Ga, As, Sb and V in real sample was discussed. Finally, the method was evaluated through recovery test and was applied to practical sample analysis, with detection limits of most of the elements being below 0.15 mug g(-1) and R.S.D. below or at approximately 10%, which indicated that this method could fully satisfy the requirements for analysis of 99.999% similar to 99.9999% high purity Te. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:1679 / 1685
页数:7
相关论文
共 22 条
[1]  
ANTONINA DH, 1981, FRE Z ANAL CHEM, V309, P396
[2]  
ATSUSHI M, 1974, MIKROCHIM ACTA, P915
[3]  
BARANOVA LL, 1985, ZAVODSK LAB, V51, P31
[4]  
EIJI T, 1995, ANAL SCI, V11, P115
[5]   DETERMINATION BY ANODIC STRIPPING VOLTAMMETRY OF SOME TRACE-ELEMENTS IN TE, PB, AND PBTE [J].
FANO, V ;
SCALVINI, M .
MICROCHEMICAL JOURNAL, 1972, 17 (01) :1-&
[6]  
GILBERT EN, 1980, ZH ANAL KHIM, V35, P1301
[7]  
GRAZHULENE SS, 1983, RADIOCHEM RADIOA LET, V57, P273
[8]   ET-AAS determination of trace analytes in high purity bismuth and tellurium oxides [J].
Karadjova, I .
MICROCHEMICAL JOURNAL, 1996, 54 (02) :144-153
[9]   Graphite furnace atomic absorption spectrometric (GFAAS) determination of Cu, Cd, Cr, Mn, Ni and Pb in tellurium metal using precipitation and ion-exchange procedures [J].
Meeravali, NN ;
Arunachalam, J .
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1997, 358 (04) :484-488
[10]   Determination of trace rare earth impurities in high-purity cerium oxide by using electrothermal vaporization ICP-AES after HPLC separation with 2-ethylhexylhydrogen 2-ethylhexylphosphonate resin as the stationary phase [J].
Qin, S ;
Hu, B ;
Qin, YC ;
Wanjau, R ;
Jiang, ZC .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2000, 15 (10) :1413-1416