Mid-IR FEL user facility FELIX

被引：7

作者：

vanderMeer, AFG

vanderWiel, MJ

机构：

[1] FOM-Inst. V. Plasmafysica R., 3430 BE Nieuwegein

来源：

APPLIED SPECTROSCOPY | 1997年 / 51卷 / 04期

关键词：

free electron laser; nonlinear spectroscopy;

D O I：

10.1366/0003702971940620

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The relative merit of the use of the free electron laser for infrared experiments (FELIX) for spectroscopy is discussed and illustrated with some examples.

引用

页码：574 / 575

页数：2

共 4 条

[1] Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films [J].

Alieva, EV ;

Beitel, G ;

Kuzik, LA ;

Sigarev, AA ;

Yakovlev, VA ;

Zhizhin, GN ;

vanderMeer, AFG ;

vanderWiel, MJ .

APPLIED SPECTROSCOPY, 1997, 51 (04) :584-591

[2]

PLANKEN PCM, COMMUNICATION

[3] Mass selective infrared spectroscopy using a free electron laser [J].

Putter, M ;

von Helden, G ;

Meijer, G .

CHEMICAL PHYSICS LETTERS, 1996, 258 (1-2) :118-122

[4] Self-dispersive sum-frequency generation at interfaces [J].

vanderHam, EWM ;

Vrehen, QHF ;

Eliel, ER .

OPTICS LETTERS, 1996, 21 (18) :1448-1450

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