Physical model of InN growth on Ga-face GaN (0001) by molecular-beam epitaxy

被引:41
作者
Dimakis, E
Iliopoulos, E
Tsagaraki, K
Georgakilas, A
机构
[1] Univ Crete, Dept Phys, Microelect Res Grp, Iraklion 71003, Greece
[2] FORTH, IESL, Iraklion 71110, Greece
关键词
D O I
10.1063/1.1891292
中图分类号
O59 [应用物理学];
学科分类号
摘要
A consistent physical model of the growth of InN on GaN (0001) by radio-frequency plasma-assisted-molecular-beam epitaxy is presented. Four distinct regimes of InN growth are observed due to the temperature dependence of indium adatoms' mobility and of the InN decomposition rate. At substrate temperatures higher than 450 degrees C, indium adatoms are highly mobile and a self-regulating mechanism of InN islands' diameter takes place, so that a stoichiometric N:In atomic ratio on the top face of the islands is established. As a result, two-dimensional growth is possible only with In/N atomic ratio on the substrate surface equal to unity. The self-regulating mechanism could be exploited to engineer self-organized nanostructures. (C) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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