Optimized preparation of cross-sectional TEM specimens of organic thin films

被引：18

作者：

Dürr, AC

Schreiber, F

Kelsch, M

Dosch, H

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[2] Univ Stuttgart, D-70550 Stuttgart, Germany

来源：

ULTRAMICROSCOPY | 2003年 / 98卷 / 01期

关键词：

cross-sectional transmission electron microscopy; sample preparation; diindenoperylene; organic thin films; metal-organic interfaces;

D O I：

10.1016/S0304-3991(03)00087-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present a route for the preparation of cross-sectional TEM specimens of crystalline organic thin films which minimizes the mechanical, chemical and thermal load of the organic film during preparation and allows to take TEM images with molecular resolution. A typical example of a thin film of diindenoperylene capped with a thin layer of gold is shown to demonstrate the application of the technique for the investigation of metal-organic interfaces. (C) 2003 Elsevier B.V. All rights reserved.

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页码：51 / 55

页数：5

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