Low-field magnetoresistance of La0.7Sr0.3MnO3 thin films with gradually changed texture

被引：49

作者：

Walter, T

Dörr, K

Müller, KH

Holzapfel, B

Eckert, D

Wolf, M

Schläfer, D

Schultz, L

Grötzschel, R

机构：

[1] IFW Dresden, D-01171 Dresden, Germany

[2] Rossendorf Inc, Forschungszentrum Rossendorf EV, D-01314 Dresden, Germany

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 15期

关键词：

D O I：

10.1063/1.123806

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A gradual change of the grain orientation with the substrate temperature (T-S) during deposition has been observed for La0.7Sr0.3MnO3 films on Y-stabilized ZrO2(100) substrates. Epitaxial growth has been found around T-S approximate to 800 degrees C. Both the low-field and the high-field magnetoresistance (MR) observed for the ferromagnetic state of these polycrystalline colossal MR manganite films were found to systematically depend on the degree of texture. The experimental results suggest a crucial role of a highly resistive region at the grain boundaries for this MR effect. (C) 1999 American Institute of Physics. [S0003-6951(99)04415-0].

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页码：2218 / 2220

页数：3

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