Broad-band amplification using a novel amplifier topology

被引:7
作者
Di Muro, R
Lowe, D
Wilson, S
机构
[1] Nortel Networks Ltd, Harlow Labs, Harlow CM17 9NA, Essex, England
[2] Univ London Imperial Coll Sci Technol & Med, London SW7 2BZ, England
关键词
erbium-doped silica fibers; erbium-doped tellurite fiber amplifiers; extended band amplification; optical amplifiers;
D O I
10.1109/68.950739
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new broad-band amplifier topology that provides a continuous gain across 75 mn (1528-1603 nm) of optical bandwidth using Er3+-doped SiO2 fiber is demonstrated. The noise figure is low and does not present any discontinuity across the entire amplification bandwidth. The topology has a buried 1550/1585-nm splitter to reduce input signal loss and to provide amplified spontaneous emission suppression. The topology has been optimized using hybrid fiber; Er3+-doped SiO2 for the first stage and Er3+-doped TeO2 for the second stage, achieving 82 nm (1526-1618 run) of optical bandwidth.
引用
收藏
页码:1073 / 1075
页数:3
相关论文
共 7 条
[1]   The Er3+-fiber gain coefficient derived from a dynamic gain tilt technique [J].
Di Muro, R .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 2000, 18 (03) :343-347
[2]  
JOLLEY NE, 1998, C OPT AMP APPL VAIL, P124
[3]   Gain and saturation characteristics of dual-wavelength-pumped silica-fibre Raman amplifiers [J].
Lewis, SAE ;
Chernikov, SV ;
Taylor, JR .
ELECTRONICS LETTERS, 1999, 35 (14) :1178-1179
[4]  
MASUDA H, 1998, C OPT AMP APPL VAIL
[5]   Gain flattened Er3+-doped tellurite fibre amplifier for WDM signals in the 1581-1616nm wavelength region [J].
Mori, A ;
Sakamoto, T ;
Shikano, K ;
Kobayashi, K ;
Hoshino, K ;
Shimizu, M .
ELECTRONICS LETTERS, 2000, 36 (07) :621-622
[6]  
Sun Y, 1998, 24TH EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION, VOL 1-3, P53, DOI 10.1109/ECOC.1998.732432
[7]   Broadband and gain-flattened amplifier composed of a 1.55 mu m-band and a 1.58 mu m-band Er3+-doped fibre amplifier in a parallel configuration [J].
Yamada, M ;
Ono, H ;
Kanamori, T ;
Sudo, S ;
Ohishi, Y .
ELECTRONICS LETTERS, 1997, 33 (08) :710-711