High resolution constant-distance mode alternating current scanning electrochemical microscopy (AC-SECM)

被引：74

作者：

Etienne, M ^{[1
]}

Schulte, A ^{[1
]}

Schuhmann, W ^{[1
]}

机构：

[1] Ruhr Univ Bochum, D-44780 Bochum, Germany

来源：

ELECTROCHEMISTRY COMMUNICATIONS | 2004年 / 6卷 / 03期

关键词：

scanning electrochemical microscopy; SECM; AC-SECM; shearforce; constant-distance mode;

D O I：

10.1016/j.elecom.2004.01.006

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Alternating current scanning electrochemical microscopy (AC-SECM) in the constant-distance mode has been established as a powerful new tool for simultaneously imaging the topography of a sample along with lateral changes in surface conductivity. An enhanced spatial resolution was achieved by using the shearforce-based distance control for operating sub-pm diameter Pt disk electrodes as active scanning probes. The performance of the technique was evaluated by imaging the pattern of conductive and insulating areas of a Pt band microelectrode array. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：288 / 293

页数：6

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