High resolution constant-distance mode alternating current scanning electrochemical microscopy (AC-SECM)

被引:74
作者
Etienne, M [1 ]
Schulte, A [1 ]
Schuhmann, W [1 ]
机构
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
关键词
scanning electrochemical microscopy; SECM; AC-SECM; shearforce; constant-distance mode;
D O I
10.1016/j.elecom.2004.01.006
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Alternating current scanning electrochemical microscopy (AC-SECM) in the constant-distance mode has been established as a powerful new tool for simultaneously imaging the topography of a sample along with lateral changes in surface conductivity. An enhanced spatial resolution was achieved by using the shearforce-based distance control for operating sub-pm diameter Pt disk electrodes as active scanning probes. The performance of the technique was evaluated by imaging the pattern of conductive and insulating areas of a Pt band microelectrode array. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:288 / 293
页数:6
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