Electrocrystallisation of tantalum in molten fluoride media

被引:23
作者
Massot, L
Chamelot, P
Palau, P
Taxil, P
机构
[1] Univ Toulouse 3, Dept Procedes Electrochim & Mat, UMR 5503, Lab Genie Chim, F-31062 Toulouse, France
[2] Pechiney CRV UR GP, F-38340 Voreppe, France
关键词
tantalum; progressive nucleation; molten fluorides; chronoamperometry; roughness;
D O I
10.1016/j.electacta.2005.03.021
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The electrochemical nucleation of tantalum in molten alkaline fluoride media is investigated using chronoamperometry in the 670-750 degrees C temperature range to optimize the operating conditions for preparing tantalum coatings for anode materials. Chronoamperometric results show that the electrodeposition process involves progressive nucleation with diffusion-controlled growth of the nuclei, which was confirmed by scanning electron microscopy. The influence of the temperature and the overpotential on the nucleation site densities is considered. Once the deposit has been obtained, plotting the roughness of the tantalum coatings as a function of the current densities reveals a minimum at about 80 mA/cm(2). This minimum is considered by the authors as a consequence of the progressive nucleation. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:5408 / 5413
页数:6
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