Hybrid amorphous and polycrystalline silicon devices for large-area electronics

被引:17
作者
Mei, P [1 ]
Boyce, JB [1 ]
Fork, DK [1 ]
Anderson, G [1 ]
Ho, J [1 ]
Lu, J [1 ]
Hack, M [1 ]
Lujan, R [1 ]
机构
[1] Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA
来源
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998 | 1998年 / 507卷
关键词
D O I
10.1557/PROC-507-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Distinct features of amorphous and polycrystalline silicon are attractive for large-area electronics. These features can be utilized in a hybrid structure which consists of both amorphous and polycrystalline silicon materials. For example, an extension of active matrix technology is the integration of peripheral drivers for the improvement of reliability, cost reduction and compactness of the packaging for large-area electronics. This goal can be approached by a combination of amorphous silicon pixel switches and polysilicon drivers. A monolithic fabrication process has been developed based on a simple modification of the amorphous silicon transistor process which uses selective area laser crystallization. This approach allows us to share many of the process steps involved in making both the amorphous and polysilicon devices. Another example of the hybrid device structure is a self-aligned amorphous silicon thin film transistor with polysilicon source and drain contacts. The advantages of the self-aligned transistor are reduction of the parasitic capacitance and scaling down of the device dimension. With a selective laser doping technique, self-aligned and short-channel amorphous silicon thin film transistors have been demonstrated.
引用
收藏
页码:3 / 12
页数:10
相关论文
共 13 条
[1]  
ANAKA T, 1993, INT ELECT DEV M 1993, P389
[2]  
KING T, 1995, WORKSH P AMLCDS 95 2, P80
[3]  
KKENDALL DL, 1969, SEMICONDUCTOR SILICO, P358
[4]  
KODERA H, 1963, JPN J APPL PHYS, V53, P3702
[5]   AN EXPERIMENTAL-STUDY OF THE SOURCE DRAIN PARASITIC RESISTANCE EFFECTS IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J].
LUAN, SW ;
NEUDECK, GW .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (02) :766-772
[6]   LASER DEHYDROGENATION CRYSTALLIZATION OF PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITED AMORPHOUS-SILICON FOR HYBRID THIN-FILM TRANSISTORS [J].
MEI, P ;
BOYCE, JB ;
HACK, M ;
LUJAN, RA ;
JOHNSON, RI ;
ANDERSON, GB ;
FORK, DK ;
READY, SE .
APPLIED PHYSICS LETTERS, 1994, 64 (09) :1132-1134
[7]  
Mei P, 1997, ELEC SOC S, V96, P51
[8]  
NISHIDA S, 1991, MATER RES SOC SYMP P, V219, P303, DOI 10.1557/PROC-219-303
[9]   A DEFECT-POOL MODEL FOR NEAR-INTERFACE STATES IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J].
POWELL, MJ ;
DEANE, SC ;
FRENCH, ID ;
HUGHES, JR ;
MILNE, WI .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1991, 63 (01) :325-336
[10]   PULSED LASER-INDUCED AMORPHIZATION OF SILICON FILMS [J].
SAMESHIMA, T ;
USUI, S .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (03) :1281-1289