Special Issue: Advanced Electron Microscopy for Catalysis

被引：6

作者：

Su, Dang Sheng ^{[1
,2
]}

机构：

[1] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany

[2] Chinese Acad Sci, Shenyang Natl Lab Mat Res, Inst Met Res, Shenyang 110016, Peoples R China

来源：

CHEMCATCHEM | 2011年 / 3卷 / 06期

关键词：

D O I：

10.1002/cctc.201100175

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：919 / 920

页数：2

共 17 条

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[2] New Strategies for e-Beam Characterization of Catalysts [J].

Howie, A. .

CHEMCATCHEM, 2011, 3 (06) :961-964

[3] ELECTRON MICROSCOPY New views of catalysts [J].

Kiely, Chris .

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[4]

Muller DA, 2009, NAT MATER, V8, P263, DOI [10.1038/NMAT2380, 10.1038/nmat2380]

[5]

Schlossmacher P., 2010, Micros. Today, V18, P14, DOI DOI 10.1017/S1551929510000404

[6]

Su D. S., 2008, ANGEW CHEM, V120, P5083, DOI 10.1002/ange.200800406

[7] Surface chemistry of Ag particles:: Identification of oxide species by aberration-corrected TEM and by DFT calculations [J].

Su, Dang Sheng ;

Jacob, Timo ;

Hansen, Thomas W. ;

Wang, Di ;

Schloegl, Robert ;

Freitag, Bert ;

Kujawa, Stephan .

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2008, 47 (27) :5005-5008

[8] Electron Tomography: From 3D Statics to 4D Dynamics [J].

Su, Dang Sheng .

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2010, 49 (50) :9569-9571

[9] High resolution EELS using monochromator and high performance spectrometer:: comparison of V2O5 ELNES with NEXAFS and band structure calculations [J].

Su, DS ;

Zandbergen, HW ;

Tiemeijer, PC ;

Kothleitner, G ;

Hävecker, M ;

Hébert, C ;

Knop-Gericke, A ;

Freitag, BH ;

Hofer, F ;

Schlögl, R .

MICRON, 2003, 34 (3-5) :235-238

[10]

SU DS, 2010, ANGEW CHEM, V122, P9763

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