Shape from Equal Thickness Contours

被引:3
作者
Cong, G [1 ]
Parvin, B [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Informat & Comp Sci Div, Berkeley, CA 94720 USA
来源
1998 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, PROCEEDINGS | 1998年
关键词
D O I
10.1109/CVPR.1998.698652
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A unique imaging modality based on Equal Thickness Contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. We present a computational framework for representing each view of an object in terms of its object thickness, and then integrating these representations into a SD surface by algebraic reconstruction. The object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features, as well as neighborhood continuity. We apply our approach to images of a sub-micron crystal structure obtained through a holographic process.
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页码:502 / 507
页数:6
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