In-process board warpage measurement in a lab scale wave soldering oven

被引:19
作者
Stiteler, MR
Ume, IC
Leutz, B
机构
[1] School of Mechanical Engineering, Georgia Institute of Technology, Atlanta
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A | 1996年 / 19卷 / 04期
关键词
fringes; shadow moire; PWB; PWBA; printed wiring board; printed airing board assembly; warpage; online measurement; automated system; electronic packaging; reliability; out-of-plane displacement; solder joints; wave solder; reflow solder; simulation; temperature control; image processing; temperature profile;
D O I
10.1109/95.554938
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An automated on-line warpage measurement system for printed wiring boards (PWB's) and printed wiring board assemblies (PWBA's) has been developed. The system is capable of simulating a variety of soldering processes, including the wave soldering process, and performing real-time PWB/PWBA warpage measurements using the shadow moire technique. The system can be used to characterize the warpage behavior of virtually any PWB/PWBA during the soldering process. Using this system, warpage of PWB test vehicles was measured during simulated wave soldering. The measured warpage varied significantly during wave soldering from that observed both before and after wave soldering. These results help us to understand how the board deforms at every stage of the soldering process.
引用
收藏
页码:562 / 569
页数:8
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