In situ X-ray diffraction study of P2-Na2/3[Ni1/3Mn2/3]O2

被引:650
作者
Lu, ZH [1 ]
Dahn, JR
机构
[1] Dalhousie Univ, Dept Phys, Halifax, NS B3H 3J5, Canada
[2] Dalhousie Univ, Dept Chem, Halifax, NS B3H 3J5, Canada
关键词
D O I
10.1149/1.1407247
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The electrochemical extraction and insertion of Na in P2-Na-2/3[Ni1/3Mn2/3]O-2 was studied by in situ X-ray diffraction. All the original Na can be extracted from P2-Na-2/3[Ni1/3Mn2/3]O-2 and it can be reversibly inserted again. When x > 1/3 in Na-x[Ni1/3Mn2/3]O-2, the compound remains in the P2 structure. For x approximate to 1/3, a small amount of O-2-type stacking faults are introduced into the structure. When x < 1/3, the electrode exists as two coexisting phases. These are P2-Na-1/3[Ni1/3Mn2/3]O-2 (with some O-2-type stacking faults) and [Ni1/3Mn2/ 3]O-2. [Ni1/3Mn2/3]O-2 adopts the O-2 structure with stacking faults. As sodium is reinserted in [Ni1/3Mn2/3]O-2 to make Na-1/3[Ni1/3Mn2/3]O-2 the P2 structure forms again. The evolution of the lattice parameters of P2-Na-x[Ni1/3Mn2/3]O-2 (1/3 < x < 2/3) with x and the lattice constants of [Ni1/3Mn2/3]O-2 are also reported. (C) 2001 The Electrochemical Society.
引用
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页码:A1225 / A1229
页数:5
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