Optical waveguiding in epitaxial PbTiO3 thin films

被引：22

作者：

Dogheche, E ^{[1
]}

Jaber, B ^{[1
]}

Remiens, D ^{[1
]}

机构：

[1] Univ Valenciennes & Hainaut Cambresis, Lab Mat Avances Ceram, Ctr Reg Innovat & Transfert Technol, F-59600 Maubeuge, France

来源：

APPLIED OPTICS | 1998年 / 37卷 / 19期

关键词：

D O I：

10.1364/AO.37.004245

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Epitaxial lead titanate (PbTiO3) thin films on SrTiO3 (100) substrate were grown in situ by radiofrequency sputtering for optical waveguiding applications. The crystalline quality of the PbTiO3 films deposited at 550 degrees C has been investigated through x-ray diffraction analysis. It indicates that thin films are completely c-axis oriented (rocking curve FWHM of 0.2 degrees for the 001 reflection). The transmission spectrum method has been used to measure the dispersion of the refractive index. At 632.8 nm, the PbTiO3 film with an (001) orientation exhibits a refractive index of 2.61, which represents 98% of the bulk material. The prism-coupling technique has been also employed to determine the optical attenuation in the planar waveguide. In this study, we report a low propagation loss of 2.2 +/- 0.2 dB/cm obtained in a PbTiO3 optical waveguide. (C) 1998 Optical Society of America.

引用

页码：4245 / 4248

页数：4

共 20 条

[1] ELECTROOPTIC EFFECTS OF (PB, LA)(ZR, TI)O3 THIN-FILMS PREPARED BY RF PLANAR MAGNETRON SPUTTERING [J].