A review of microstrip T-Resonator method in determining the dielectric properties of printed circuit board materials

被引：103

作者：

Laetti, K.-P. ^{[1
]}

Kettunen, M. ^{[1
]}

Stoem, Juha-Pekka ^{[1
]}

Silventoinen, P. ^{[1
]}

机构：

[1] Lappeenranta Univ Technol, Dept Elect Engn, Lappeenranta 53851, Finland

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2007年 / 56卷 / 05期

关键词：

dielectric measurements; loss measurement; permittivity measurement; transmission line resonator;

D O I：

10.1109/TIM.2007.903587

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

When designing devices at microwave frequencies, the characteristics of printed circuit board materials have to be well known in order to attain exact functionality. The characterization can be carried out with the microstrip T-resonator test method described in this paper. With the modifications presented by the authors, the microstrip T-resonator method can be applied with improved accuracy to dielectric characterization as well as to temperature dependence measurements of the printed circuit board materials. The results obtained with the microstrip T-resonator method are also compared to the results given by the microstrip ring resonator test method.

引用

页码：1845 / 1850

页数：6

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