Matching planar maps

被引:99
作者
Alt, H
Efrat, A
Rote, G
Wenk, C
机构
[1] Univ Arizona, Dept Comp Sci, Tucson, AZ 85721 USA
[2] Free Univ Berlin, Inst Informat, D-14195 Berlin, Germany
关键词
ALGORITHMS;
D O I
10.1016/S0196-6774(03)00085-3
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g., computer vision, geographic information systems, etc. More precisely, we define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well-known Frechet distance for curves. We first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure, we give an algorithm for the general case where both, H and G, are geometric graphs. (C) 2003 Elsevier Inc. All rights reserved.
引用
收藏
页码:262 / 283
页数:22
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