The new external beam facility of the Oxford scanning proton microprobe

被引：25

作者：

Grime, GW ^{[1
]}

Abraham, MH ^{[1
]}

Marsh, MA ^{[1
]}

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 181卷

关键词：

ion beam analysis; microbeam analysis; non-destructive analysis; PIXE; RBS;

D O I：

10.1016/S0168-583X(01)00616-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

This paper describes the development of a high spatial resolution external beam facility on one of the beamlines of the Oxford scanning proton microprobe tandem accelerator. Using a ma magnetic quadrupole doublet to focus the beam through the Kapton exit window a beam diameter of < 50 mum full width at half maximum (fwhm) can be achieved on a sample located at 4 mm from the exit window. The facility is equipped with two Si-Li X-ray detectors for proton-induced X-ray emission (PIXE) analysis of light and trace elements respectively, a surface barrier detector for Rutherford backscattering spectrometry (RBS) analysis and a HP-Ge detector for gamma -ray detection. The mechanical and beam-optical design of the system is described. (C) 2001 Elsevier Science B.V. All rights reserved.

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收藏

页码：66 / 70

页数：5

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