Precision measurements using a curved position-sensitive detector

被引:22
作者
Roux, J
Volfinger, M
机构
来源
JOURNAL DE PHYSIQUE IV | 1996年 / 6卷 / C4期
关键词
D O I
10.1051/jp4:1996413
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Position sensitive curved detectors offers various advantages in XRD experiments. However a specific calibration and measurement protocol is required in order to achieve accurate results. To estimate the resolution and reproducibility of the measurements, and to assess the shape and size of the systematic deviations front the best linear calibration of the detector setup, diffractograms were obtained on a standard mixture over a long period of time.
引用
收藏
页码:127 / 134
页数:8
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