Investigation of laser plasma for solid element composition microanalysis

被引:12
作者
Detalle, V [1 ]
Lacour, JL [1 ]
Mauchien, P [1 ]
Semerok, A [1 ]
机构
[1] CEA Saclay, DPE, SPCP, LSLA, F-91191 Gif Sur Yvette, France
关键词
laser plasma; laser ablation; excitation temperature;
D O I
10.1016/S0169-4332(98)00410-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Analytical characteristics (LTE existence, excitation temperature, plasma plume expansion, duration of analytical spectral lines) of the plasma formed at atmospheric pressure after sharply focused laser beam/solid surface interaction were under investigation. At the time interval of analytical interest (100-400 ns) microplasma was found under LTE conditions with excitation temperature up to 10,000 K and its volume was spatially stabilised. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:299 / 301
页数:3
相关论文
共 7 条
  • [1] CHALEARD C, 1997, J ANAL ATOM SPECTROS, V12, P1983
  • [2] FUHR JR, 1981, J PHYS CHEM-US, V10, P307
  • [3] Evaluation of laser ablation optical emission spectrometry for microanalysis in aluminium samples
    Geertsen, C
    Lacour, JL
    Mauchien, P
    Pierrard, L
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1996, 51 (11) : 1403 - 1416
  • [4] QUANTITATIVE ELEMENTAL ANALYSIS OF IRON-ORE BY LASER-INDUCED BREAKDOWN SPECTROSCOPY
    GRANT, KJ
    PAUL, GL
    ONEILL, JA
    [J]. APPLIED SPECTROSCOPY, 1991, 45 (04) : 701 - 705
  • [5] ELECTRON-TEMPERATURE AND DENSITY PROFILES OF EXCIMER LASER-INDUCED PLASMAS
    GRANT, KJ
    PAUL, GL
    [J]. APPLIED SPECTROSCOPY, 1990, 44 (08) : 1349 - 1354
  • [6] DETECTOR FOR TRACE ELEMENTAL ANALYSIS OF SOLID ENVIRONMENTAL-SAMPLES BY LASER-PLASMA SPECTROSCOPY
    WISBRUN, R
    SCHECHTER, I
    NIESSNER, R
    SCHRODER, H
    KOMPA, KL
    [J]. ANALYTICAL CHEMISTRY, 1994, 66 (18) : 2964 - 2975
  • [7] Detection of metals in the environment using a portable laser-induced breakdown spectroscopy instrument
    Yamamoto, KY
    Cremers, DA
    Ferris, MJ
    Foster, LE
    [J]. APPLIED SPECTROSCOPY, 1996, 50 (02) : 222 - 233