The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement

被引：586

作者：

Popa, NC ^{[1
]}

机构：

[1] Inst Phys & Technol, Bucharest, Romania

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1998年 / 31卷

关键词：

D O I：

10.1107/S0021889897009795

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Models are presented which are compatible with the Rietveld method for the anisotropic broadening of the diffracted peaks produced by crystallite size and microstrain. The models, derived from general crystallographic considerations, are different for different Laue groups.

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页码：176 / 180

页数：5

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