Ionic Space-Charge Depletion in Lithium Fluoride Thin Films on Sapphire (0001) Substrates

被引:31
作者
Li, Chilin [1 ]
Guo, Xiangxin [2 ]
Gu, Lin [3 ]
Samuelis, Dominik [1 ]
Maier, Joachim [1 ]
机构
[1] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
[2] Shanghai Inst Ceram CAS, Key Lab Transparent & Optofunct Inorgan Mat, Shanghai 200050, Peoples R China
[3] Tohoku Univ, WPI Adv Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
关键词
DEFECT CHEMISTRY; CONDUCTIVITY; TRANSPORT; LIF; DIFFUSION; HALIDES; STORAGE;
D O I
10.1002/adfm.201100303
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Lithium fluoride thin films with various thicknesses have been grown on c-plane sapphire substrates by radio-frequency sputtering. The thin films are granular with a preferential [111] orientation of the grains. Thickness-dependent measurements allow the separation of bulk and interface conductions. The normalized conductance decreases linearly with decreasing LiF layer thickness with a negative extrapolated intercept. DC polarization, AC impedance spectroscopy and electromotive force measurement indicate depletion of lithium ion vacancies as majority charge carriers and hence a negative space-charge potential. A generalized Mott-Schottky approach within the model of heterogeneous doping fully explains the entire boundary defect chemistry.
引用
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页码:2901 / 2905
页数:5
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