Accurate measurement of scattering and absorption loss in microphotonc devices

被引：33

作者：

Borselli, Matthew ^{[1
]}

Johnson, Thomas J. ^{[1
]}

Painter, Oskar ^{[1
]}

机构：

[1] CALTECH, Dept Appl Phys, Pasadena, CA 91125 USA

来源：

OPTICS LETTERS | 2007年 / 32卷 / 20期

关键词：

D O I：

10.1364/OL.32.002954

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials in which both nonlinear and linear absorption are present and requires only limited knowledge of absolute optical power levels, material parameters, and the structure geometry. The technique is applied to high-quality-factor (Q=1 x 10(6) to Q=5 x 10(6)) silicon-on-insulator (SOI) microdisk resonators. It is determined that linear absorption can account for more than half of the total optical loss in the high-Q regime of these devices. (C) 2007 Optical Society of America

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页码：2954 / 2956

页数：3

相关论文

共 14 条

[1] Separation of radiation and absorption losses in two-dimensional photonic crystal single defect cavities [J].

Alvarado-Rodriguez, I ;

Yablonovitch, E .

JOURNAL OF APPLIED PHYSICS, 2002, 92 (11) :6399-6402

[2] Nonlinear response of silicon photonic crystal microresonators excited via an integrated waveguide and fiber taper [J].

Barclay, PE ;

Srinivasan, K ;

Painter, O .

OPTICS EXPRESS, 2005, 13 (03) :801-820

[3] Compact silicon tunable Fabry-Perot resonator with low power consumption [J].

Barrios, CA ;

Almeida, VR ;

Panepucci, RR ;

Schmidt, BS ;

Lipson, M .

IEEE PHOTONICS TECHNOLOGY LETTERS, 2004, 16 (02) :506-508

[4] Beyond the Rayleigh scattering limit in high-Q silicon microdisks:: theory and experiment [J].

Borselli, M ;

Johnson, TJ ;

Painter, O .

OPTICS EXPRESS, 2005, 13 (05) :1515-1530

[5] Measuring the role of surface chemistry in silicon microphotonics [J].

Borselli, M ;

Johnson, TJ ;

Painter, O .

APPLIED PHYSICS LETTERS, 2006, 88 (13)

[6]

Choi S.J., 2004, IEEE Photonics Tech. Lett, V17, P2101

[7] THERMOOPTIC MODULATION AT 1.5 MU-M IN SILICON ETALON [J].

COCORULLO, G ;

RENDINA, I .

ELECTRONICS LETTERS, 1992, 28 (01) :83-85

[8] Third-order nonlinearities in silicon at telecom wavelengths [J].

Dinu, M ;

Quochi, F ;

Garcia, H .

APPLIED PHYSICS LETTERS, 2003, 82 (18) :2954-2956

[9] Electrically pumped hybrid AlGaInAs-silicon evanescent laser [J].

Fang, Alexander W. ;

Park, Hyundai ;

Cohen, Oded ;

Jones, Richard ;

Paniccia, Mario J. ;

Bowers, John E. .

OPTICS EXPRESS, 2006, 14 (20) :9203-9210

[10] Rayleigh scattering in high-Q microspheres [J].

Gorodetsky, ML ;

Pryamikov, AD ;

Ilchenko, VS .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2000, 17 (06) :1051-1057