Surface characterization of metallic molecular organic thin films: tetrathiafulvalene tetracyanoquinodimethane

被引：33

作者：

Rojas, C

Caro, J

Grioni, M

Fraxedas, J

机构：

[1] CSIC, Inst Ciencia Mat Barcelona, E-08193 Bellaterra, Spain

[2] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

来源：

SURFACE SCIENCE | 2001年 / 482卷

关键词：

angle resolved photoemission; X-ray photoelectron spectroscopy; polycrystalline thin films; metallic films;

D O I：

10.1016/S0039-6028(01)00715-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The electronic structure of ex situ grown highly oriented thin films of the quasi-ID organic metal tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) has been characterized by means of temperature-dependent high-resolution angle-resolved photoemission spectroscopy and X-ray photoelectron spectroscopy. Band dispersion near the Fermi level (EF) is observed at low temperatures (similar to 100 K) for as-received samples. At room temperature both charged and neutral TCNQ species (TCNQ(-) and TCNQ(0), respectively) coexist at the surface. The presence of TCNQ(0), partly due to surface thermal vibrations. is reduced at lower temperatures because of the smaller surface oscillation amplitudes. (C) 2001 Elsevier Science B.V. All rights reserved.

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收藏

页码：546 / 551

页数：6

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