Profile analysis in asymmetric powder diffraction with parallel beam geometry and Curved Position Sensitive detector

被引：19

作者：

Masson, O ^{[1
]}

Guinebretiere, R ^{[1
]}

Dauger, A ^{[1
]}

机构：

[1] ENSCI, UPRESA CNRS 6015, Lab Mat Ceram & Traitements Surface, F-87065 Limoges, France

来源：

EPDIC 5, PTS 1 AND 2 | 1998年 / 278-2卷

关键词：

line profile analysis; whole-powder-pattern fitting; Curved Position Sensitive detector; parallel beam geometry;

D O I：

10.4028/www.scientific.net/MSF.278-281.115

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The instrumental function of a high resolution asymmetric X-rays diffraction equipment was investigated. The broadening contributions of focal spot size, monochromator, specimen transparency, geometrical effects and thermal noise of the position sensitive detector were analysed and convoluted to synthesise the line profile shapes on a wide angular range. Taking into account the real instrumental function, the anisotropic shape of TiO2 aerogels nano-crystals was determined by line profile analysis and whole pattern fitting.

引用

页码：115 / 120

页数：6

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