Optical constants and growth mode of Ni films deposited on evaporated Al, Ag and Cu films

Information about the optical constants and structures of Ni films in Ni/Al(AlOx. Al), Ni/Ag and Ni/Cu(CuOx. Cu) bilayer systems are obtained through an attenuated total reflection (ATR) analysis, scanning electron spectroscopy (SEM) observation and the X-ray diffraction measurements. In particular, the optical constants of the Ni films are evaluated at various stages of growth. It is finally concluded that the Ni films show island growth for the Ni/Al(AlOx. Al) and Ni/CuOx. Cu bilayers, whereas layer-by-layer growth is found for the Ni films in the Ni/Cu system. It is confirmed from SEM images that the Ni him on the Ag him shows island growth, but the ATR experimental results indicate that it becomes continuous at a very early stage of growth. (C) 1998 Elsevier Science B.V. All rights reserved.