Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

被引:22
作者
Jiang, ZT [1 ]
Thurgate, SM [1 ]
Wilkie, P [1 ]
机构
[1] Murdoch Univ, Div Sci, Murdoch, WA 6150, Australia
关键词
Auger photoelectron spectroscopy; x-ray photoelectron spectroscopy; copper;
D O I
10.1002/sia.990
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2P(3/2) from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2P(3/2) lines in coincidence with Auger (1)G and F-3 terms of Cu L3VV from Cu. Comparison of the L3VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p(3/2) lines in coincidence with (1)G and F-3 terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper. Copyright (C) 2001 John Wiley & Sons, Ltd.
引用
收藏
页码:287 / 290
页数:4
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