Studies on a possible growth mechanism of silver nanoparticles loaded on TiO2 thin films by photoinduced deposition method

被引:20
作者
He, Xin [1 ]
Zhao, Xiujian [1 ]
Liu, Baoshun [1 ]
机构
[1] Wuhan Univ Technol, Minist Educ, Key Lab Silicate Mat Sci & Engn, Wuhan 430070, Hubei, Peoples R China
关键词
atomic force microscopes (AFM); nanocrystals; nucleation and growth; microscopy of surfaces; interfaces; and thin films; optical properties of specific thin films;
D O I
10.1016/j.jnoncrysol.2006.11.037
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 [材料科学与工程]; 080502 [材料学];
摘要
The TiO2 thin films loaded with silver nanoparticles were prepared on soda-lime glass substrates by a photoinduced deposition method. The TiO2 films immersed in AgNO3 Solution were vertically irradiated by UV light with center wavelength of 365 nm for 60 h. The as-produced films were characterized by X-ray diffraction (XRD), U-V-Vis spectroscopy, X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The studies show that the film after UV excitation is composed of anatase phase TiO2 and metallic silver with face centered cubic structure. A possible growth mechanism of silver nanoparticles on TiO2 thin films under LTV irradiation was proposed. The charge carriers of TiO2 semiconductor are generated by photoexcitation. Owing to the conduction band position of TiO2 which is above the standard potential of Ag+/Ag, the generated electrons could transfer from the conduction band to Ag+ adsorbed on the surface of the TiO2 films. Therefore, the Ag+ was finally reduced into a Ag atom, which could preferentially localize in the grain boundaries of TiO2 particles due to high surface free energy there. With the irradiation time extended, silver nanoparticles were shaped into certain morphologies on the surface of the TiO2 films. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:1267 / 1271
页数:5
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