Evaluating mechanical properties of thin layers using nanoindentation and finite-element modeling: Implanted metals and deposited layers

被引:14
作者
Knapp, JA
Follstaedt, DM
Barbour, JC
Myers, SM
Ager, JW
Monteiro, OR
Brown, IG
机构
来源
MATERIALS MODIFICATION AND SYNTHESIS BY ION BEAM PROCESSING | 1997年 / 438卷
关键词
D O I
10.1557/PROC-438-617
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a methodology based on finite-element modeling of nanoindentation data to extract reliable and accurate mechanical properties from thin, hard films and surface-modified layers on softer substrates. The method deduces the yield stress, Young's modulus, and hardness from indentations as deep as 50% of the layer thickness.
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页码:617 / 625
页数:9
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