Local electronic density of states of a semiconducting carbon nanotube interface

被引:12
作者
Kim, H [1 ]
Lee, J
Lee, S
Kuk, Y
Park, JY
Kahng, SJ
机构
[1] Seoul Natl Univ, Sch Phys, Seoul 151742, South Korea
[2] Seoul Natl Univ, Ctr Sci Nanometer Scale, Seoul 151742, South Korea
[3] Ajou Univ, Dept Phys, Suwon 442749, South Korea
[4] Korea Univ, Dept Phys, Seoul 136713, South Korea
关键词
D O I
10.1103/PhysRevB.71.235402
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The local electronic structure of semiconducting single-wall carbon nanotubes was studied with scanning tunneling microscopy. We performed scanning tunneling spectroscopy measurement at selected locations on the center axis of carbon nanotubes, acquiring a map of the electronic density of states. Spatial oscillation was observed in the electronic density of states with the period of atomic lattice. Defect induced interface states were found at the junctions of the two semiconducting nanotubes, which are well-understood in analogy with the interface states of bulk semiconductor heterostructures. The electronic leak of the van Hove singularity peaks was observed across the junction, due to inefficient charge screening in a one-dimensional structure.
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页数:4
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