Single event effects in pulse width modulation controllers

被引：20

作者：

Penzin, SH

Crain, WR

Crawford, KB

Hansel, SJ

Kirshman, JF

Koga, R

机构：

[1] Aerospace Corporation, El Segundo, CA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 06期

关键词：

D O I：

10.1109/23.556893

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed using both Set-Reset (SR) flip-flops and Toggle (T) flip-flops which are vulnerable to single event upset (SECT) in a radiation environment. Depending on the implementation of the different devices the effect can be significant in spaceflight hardware.

引用

页码：2968 / 2973

页数：6