Dynamics of perpendicular recording heads

被引：7

作者：

Litvinov, D ^{[1
]}

Chomko, R

Wolfson, J

Svedberg, E

Bain, J

White, R

Chantrell, R

Khizroev, S

机构：

[1] Seagate Res, Pittsburgh, PA USA

[2] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA

[3] Univ Miami, Coral Gables, FL 33124 USA

[4] Univ Wales, Bangor, Gwynedd, Wales

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2001年 / 37卷 / 04期

关键词：

focused ion beam (FIB); next generation magnetic recording systems; perpendicular recording dynamics;

D O I：

10.1109/20.950846

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

3D modeling and inductance measurements were used to design an ultra-high frequency perpendicular system. Kerr microscopy and spin-stand experiments with focused ion beam (FI-B) trimmed perpendicular heads and perpendicular media directly verified the high frequency concepts.

引用

页码：1376 / 1378

页数：3

共 10 条

[1] SNR and density limit estimates: A comparison of longitudinal and perpendicular recording [J].