Microwave absorption materials -: IV Preparation of the mixed layer structure phases, RexTa1-xS2 and OsxTa1-xS2, and some electrical and magnetic properties

被引：5

作者：

Hayashi, K ^{[1
]}

Serikawa, D ^{[1
]}

Maeda, N ^{[1
]}

Okamoto, A ^{[1
]}

Ikeuchi, T ^{[1
]}

机构：

[1] Okayama Univ Sci, Lab Solid State Chem, Okayama 700, Japan

来源：

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2000年 / 20卷 / 16期

关键词：

electrical conductivities; functional applications; magnetic properties; X-ray method;

D O I：

10.1016/S0955-2219(00)00231-4

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The binary systems ReS2-TaS2 and OsS2-TaS2 are studied. Mixed layer structure (MLS) phases are found in RexTa1-xS2 with a composition range of 0.25 less than or equal to x less than or equal to 0.5, as well as in the OsxTa1-xS2 with a composition range of 0.26 less than or equal to x less than or equal to 0.33. The MLSs of both phases are constructed by a random and mixed stacking of the 2Hb-layers and 3R-layers. The magnetic susceptibilities of samples from both phases show a weak Pauli-paramagnetism, The paramagnetic moment and the electrical conductivity of both phases decrease as the composition x increases. The behaviour of the paramagnetic moment and the electrical conductivity of those phases offer us a good example of the number of conduction electrons and their effect. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：2735 / 2742

页数：8

共 6 条

[1]

FURUSHO M, 1994, Patent No. 418490

[2]

FURUSHO M, 1995, Patent No. 5182517

[3] MIXED LAYERS IN M(X)TA(1-X)SE(2) (M=RE, OS 0-LESS-THAN-X-LESS-THAN-1) [J].