Monitoring technology trends through patent analysis: a case study of thin film

被引：10

作者：

Bhattacharya, S ^{[1
]}

Khan, MTR ^{[1
]}

机构：

[1] Natl Inst Sci Technol & Dev Studies, New Delhi 110012, India

来源：

RESEARCH EVALUATION | 2001年 / 10卷 / 01期

关键词：

D O I：

10.3152/147154401781777187

中图分类号：

G25 [图书馆学、图书馆事业]; G35 [情报学、情报工作];

学科分类号：

1205 ; 120501 ;

摘要：

The trends and directions of an important area, thin film technology, is explored through analysis of US patents, comparing activity in 1989, 1993 and 1997, and 1993-1997 in detail, A classification system for all the patents in our data set under technological sector(s) and subsector(s) helps determine the major application areas of 'thin film technology', and thence broader subunits, The commonality and specificity of these sub-units over the time periods are delineated, The profiles of companies active in this technology are examined, including major application areas, changes in their application profile over the time periods, their main operational areas, international rankings, etc. Detailed inspection of the profile in 1993-1997 shows what the future trend might be in this technology.

引用

页码：33 / 45

页数：13

共 20 条

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