Longitudinal patent analysis for nanoscale science and engineering: Country, institution and technology field

被引:132
作者
Huang, Z [1 ]
Chen, HC
Yip, A
Ng, G
Guo, F
Chen, ZK
Roco, MC
机构
[1] Univ Arizona, Eller Coll Business & Publ Adm, Dept Management Informat Syst, Artificial Intelligence Lab, Tucson, AZ 85721 USA
[2] Natl Sci Fdn, Arlington, VA 22230 USA
基金
美国国家科学基金会;
关键词
patent analysis; nanotechnology; nanoscience; knowledge discovery; information visualization; self-organizing map; citation networks;
D O I
10.1023/A:1025556800994
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nanoscale science and engineering (NSE) and related areas have seen rapid growth in recent years. The speed and scope of development in the field have made it essential for researchers to be informed on the progress across different laboratories, companies, industries and countries. In this project, we experimented with several analysis and visualization techniques on NSE-related United States patent documents to support various knowledge tasks. This paper presents results on the basic analysis of nanotechnology patents between 1976 and 2002, content map analysis and citation network analysis. The data have been obtained on individual countries, institutions and technology fields. The top 10 countries with the largest number of nanotechnology patents are the United States, Japan, France, the United Kingdom, Taiwan, Korea, the Netherlands, Switzerland, Italy and Australia. The fastest growth in the last 5 years has been in chemical and pharmaceutical fields, followed by semiconductor devices. The results demonstrate potential of information-based discovery and visualization technologies to capture knowledge regarding nanotechnology performance, transfer of knowledge and trends of development through analyzing the patent documents.
引用
收藏
页码:333 / 363
页数:31
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