Work function at the tips of multiwalled carbon nanotubes

被引：217

作者：

Gao, RP ^{[1
]}

Pan, ZW ^{[1
]}

Wang, ZL ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA

来源：

APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 12期

关键词：

D O I：

10.1063/1.1356442

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14-55 nm. Majority of the nanotubes have a work function of 4.6-4.8 eV at the tips, which is 0.2-0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of similar to5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube. (C) 2001 American Institute of Physics.

引用

页码：1757 / 1759

页数：3

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