Strain compensation by twinning in Au thin films: Experiment and model

被引:24
作者
Dehm, G.
Oh, S. H.
Gruber, P.
Legros, M.
Fischer, F. D.
机构
[1] Austrian Acad Sci, Erich Schmid Inst Mat Sci, Dept Mat Sci, A-8700 Leoben, Austria
[2] Univ Stuttgart, Inst Phys Met, Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[3] CNRS, CEMES, F-31055 Toulouse, France
[4] Univ Leoben, Inst Mech, A-8700 Leoben, Austria
关键词
size effect; twinning; thin films; TEM; modeling;
D O I
10.1016/j.actamat.2007.08.027
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial Au thin films with thicknesses of 40-160 nm were grown on (100)-oriented single-crystal NaCl substrates at 300 degrees C by magnetron sputtering. Microstructural analyses revealed that all films possess orthogonal twin networks along the < 011 > directions. The experimentally observed relationship of an increase in twin density with decreasing film thickness is explained by kinematical and thermodynamical modeling. The developed twin model predicts a nanometer-sized width of the twins, in agreement with the experiment. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:6659 / 6665
页数:7
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