Generative inspection process and probe path planning for coordinate measuring machines

被引:28
作者
Gu, P
Chan, K
机构
[1] University of Saskatchewan, Saskatoon, SK
关键词
coordinate measuring machines; inspection process planning; probe path planning; object-oriented systems;
D O I
10.1016/0278-6125(96)84550-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents an object-oriented generative inspection planning system developed in a STEP-based generic product modeling environment. The planning system consists of an object-oriented inspection process plan ner and an object-oriented inspection path planner. The inspection process planner retrieves inspection-related information, including dimensions, tolerances, and geometric items, from STEP model libraries to create inspection process plans using linear planning techniques. The inspection process plans, which consist of items for inspection, measurement sequence, and the number of measurement points on supporting surfaces, are then used by the inspection path planner to generate a collision-free inspection probe path. The corresponding results from the path planner are converted into programs and are transferred to a graphical environment for simulation to ensure the validity of the planning process. Examples are included to illustrate concepts, planning strategies, algorithms, and systems.
引用
收藏
页码:240 / 255
页数:16
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