Surface interface-related conductivity in nanometer thick YSZ films

Results of the electrical conductivity study of highly textured, ultrathin (15 nm) cubic yttria-stabilized zirconia (YSZ) thin films are presented for the first time. A nanoscale effect that results in exceptionally high ionic conductivity at moderate temperatures is detected in films less than 60 nm thick. The conductivity increases continuously below this level and reaches 0.6 S/cm at 800 degrees C for a 15 nm thick film, which represents the highest reported value for the YSZ system. The observed behavior is attributed to an increasingly significant contribution of the surface/interface conductivity with decreasing film thickness. These observations can have important implications for the development of nanostructured electrochemical devices with enhanced performance. (C) 2004 The Electrochemical Society.