Analysis of flow between a wafer and pad during CMP precesses

In this paper, we summarize the development of a numerical model for the chemical mechanical planarization (CMP) process and experimentally investigate the effects of pad conditioning on slurry transport and mixing. A simplified five-dimensional numerical model of slurry flow beneath a stationary wafer was developed to determine the pressure and shear stress beneath a wafer. The initial results indicate that in the hydrodynamic regime a positive upward pressure is exerted on the wafer. We also examined three cases to study pad effects on slurry transport; polishing with an Embossed Politer pad, an unconditioned IC1000 pad, and a conditioned IC1000 pad. Cab-O-Sperse SCI slurry was used in a 1:1.5 dilution with water, Mixing data show that conditioning has a negligible effect on the rate of slurry entrainment and mixing; however, conditioning has a large effect on the thickness of the slurry layer between the wafer and pad. Conditioning was found to increase the slurry thickness by a factor of two. In addition the gradients in slurry age beneath the wafer were compared among the three cases. The IC1000 pads supported a gradient in the inner third of the wafer only, while the Embossed Politer pad showed a linear gradient across the wafer implying it retains pockets of unmixed slurry in the embossed topography.