Determination of catalyst metal residues in polymers by X-ray fluorescence

被引：31

作者：

Bichinho, KM

Pires, GP

Stedile, FC

dos Santos, JHZ

Wolf, CR

机构：

[1] UFRGS, Inst Quim, BR-91501970 Porto Alegre, RS, Brazil

[2] CIENTEC, Fundacao Ciencia Tecnol, BR-90010460 Porto Alegre, RS, Brazil

[3] Ipiranga Petroquim SA, Dept Desenvolvimento Produto, BR-95853000 Triunfo, RS, Brazil

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2005年 / 60卷 / 05期

关键词：

metal; polymer; Rutherford backscattering spectrometry; XRF; TXRF;

D O I：

10.1016/j.sab.2004.11.012

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Commercial polyethylenes produced by Ziegler-Natta, Philips and metallocene technology were analyzed by X-ray fluorescence spectroscopy. Synthetic standards using wax matrix was shown to be suitable for the calibration curve in comparison to those prepared by milling and grinding virgin polymer mixed with standard metal oxide as matrix. The detection limits obtained for the studied metal in the different polymers were: 12 mg kg(-1) for Mg, 0.8 mg kg(-1) for Ti, 1.6 mg kg(-1) for Cr, 1.2 mg kg(-1) for Zr and 1.9 mg kg(-1) for V For comparative reasons, the determination of residual metal content by Rutherford backscattering spectrometry (RBS) and total-reflection X-ray fluorescence spectrometry (TXRF) is also discussed. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：599 / 604

页数：6

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