Elemental mapping using proton-induced x-rays

被引:32
作者
Przybylowicz, WJ
Mesjasz-Przybylowicz, J
Pineda, CA
Churms, CL
Ryan, CG
Prozesky, VM
Frei, R
Slabbert, JP
Padayachee, J
Reimold, WU
机构
[1] Natl Accelerator Ctr, Mat Res Grp, ZA-7131 Faure, South Africa
[2] Groote Schuur Hosp, Dept Med, ZA-7925 Cape Town, South Africa
[3] CSIRO Explorat & Min, N Ryde, NSW 2113, Australia
[4] Kobenhavns Univ, Inst Geol, DK-1350 Copenhagen, Denmark
[5] Natl Accelerator Ctr, Radiat Biophys Div, ZA-7131 Faure, South Africa
[6] Univ Witwatersrand, Dept Geol, ZA-2050 Johannesburg, South Africa
关键词
D O I
10.1002/xrs.474
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The use of particle-induced x-ray emission (PIXE) in conjunction with a scanning nuclear microprobe (SNM) offers one of the few microanalytical techniques capable of studies of elemental concentrations at the ppm level, with a spatial resolution of the order of 1 mum. Beam scanning capabilities and advanced data treatment make it a technique of choice for quantitative two-dimensional studies of elemental distribution. Although the ultimate aim is to obtain true quantitative elemental maps, free of concentration or thickness artifacts, some compromises are necessary owing to experimental and computational restrictions. Some approaches currently used are discussed with emphasis on true elemental imaging using the dynamic analysis method. Examples of applications in geology and biology are shown to illustrate its benefits and limitations. Copyright (C) 2001 John Wiley & Sons, Ltd.
引用
收藏
页码:156 / 163
页数:8
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