Infrared regular reflectance and transmittance instrumentation and standards at NIST

被引：11

作者：

Kaplan, SG ^{[1
]}

Hanssen, LM ^{[1
]}

机构：

[1] NIST, Opt Technol Div, Gaithersburg, MD 20899 USA

来源：

ANALYTICA CHIMICA ACTA | 1999年 / 380卷 / 2-3期

关键词：

infrared regular reflectance; transmittance; FT-IR measurements; beam geometry;

D O I：

10.1016/S0003-2670(98)00670-9

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Instrumentation is described that has been constructed at the National Institute of Standards and Technology (NIST) for the measurement of regular reflectance and transmittance over the 2-25 mu m wavelength region. This includes both specialized accessories used with Fourier-transform infrared (FT-IR) spectrometers and laser-based systems for high optical density transmittance measurements. The FT-IR systems have been used to develop standard reference materials for IR regular transmittance. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

引用

页码：303 / 310

页数：8

共 19 条

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[2]

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